Smart Exam Malpractice Detection and Evidence Capture YOLO. International Journal of Engineering & Extended Technologies Research (IJEETR), [S. l.], v. 8, n. 2, p. 1997–2004, 2026. DOI: 10.15662/IJEETR.2026.0802168. Disponível em: https://ijeetr.com/index.php/ijeetr/article/view/574. Acesso em: 22 apr. 2026.