Intelligent Defect Prediction and Yield Optimization in PCB Assembly Lines Using Deep Learning-Based Vision Systems and Reinforcement Learning Process Control. International Journal of Engineering & Extended Technologies Research (IJEETR), [S. l.], v. 8, n. 2, p. 4679–4686, 2026. DOI: 10.15662/IJEETR.2026.0802476. Disponível em: https://ijeetr.com/index.php/ijeetr/article/view/941. Acesso em: 1 jun. 2026.